Invention Grant
- Patent Title: Workpiece processing method
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Application No.: US16111622Application Date: 2018-08-24
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Publication No.: US10559472B2Publication Date: 2020-02-11
- Inventor: Masahiro Tabata , Toru Hisamatsu , Yoshihide Kihara
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2017-162600 20170825
- Main IPC: H01L21/3065
- IPC: H01L21/3065 ; H01J37/32 ; H01L21/308 ; H01L21/683

Abstract:
An embodiment of the present disclosure provides a method of processing a workpiece in which a plurality of holes are formed on a surface of the workpiece. The method includes a first sequence including a first process of forming a film with respect to an inner surface of each of the holes and a second process of isotropically etching the film. The first process includes a film forming process using a plasma CVD method, and the film contains silicon.
Public/Granted literature
- US20190067019A1 WORKPIECE PROCESSING METHOD Public/Granted day:2019-02-28
Information query
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