Invention Grant
- Patent Title: Method for manufacturing monolithic three-dimensional (3D) integrated circuits
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Application No.: US15633016Application Date: 2017-06-26
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Publication No.: US10559563B2Publication Date: 2020-02-11
- Inventor: Jean-Pierre Colinge , Carlos H. Diaz , Ta-Pen Guo
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Potashnik LLC
- Main IPC: H01L27/11578
- IPC: H01L27/11578 ; H01L27/06 ; H01L23/522 ; H01L23/528 ; H01L21/8234 ; H01L21/683 ; H01L21/306 ; H01L21/324 ; H01L29/08 ; H01L21/822 ; H01L29/06 ; H01L29/423 ; H01L29/786 ; H01L29/78 ; H01L21/8238

Abstract:
A method for manufacturing a monolithic three-dimensional (3D) integrated circuit (IC) with junctionless semiconductor devices (JSDs) is provided. A first interlayer dielectric (ILD) layer is formed over a semiconductor substrate, while also forming first vias and first interconnect wires alternatingly stacked in the first ILD layer. A first doping-type layer and a second doping-type layer are transferred to a top surface of the first ILD layer. The first and second doping-type layers are stacked and are semiconductor materials with opposite doping types. The first and second doping-type layers are patterned to form a first doping-type wire and a second doping-type wire overlying the first doping-type wire. A gate electrode is formed straddling the first and second doping-type wires. The gate electrode and the first and second doping-type wires at least partially define a JSD.
Public/Granted literature
- US20180374845A1 METHOD FOR MANUFACTURING MONOLITHIC THREE-DIMENSIONAL (3D) INTEGRATED CIRCUITS Public/Granted day:2018-12-27
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