Invention Grant
- Patent Title: Measuring operational parameters at the guided surface waveguide probe
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Application No.: US15909632Application Date: 2018-03-01
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Publication No.: US10559866B2Publication Date: 2020-02-11
- Inventor: James F. Corum , Kenneth L. Corum , Timothy J. Lougheed, Jr. , Jerry A. Lomax
- Applicant: CPG Technologies, LLC
- Applicant Address: US TX Italy
- Assignee: CPG TECHNOLOGIES, INC
- Current Assignee: CPG TECHNOLOGIES, INC
- Current Assignee Address: US TX Italy
- Agency: Thomas | Horstemeyer, LLP
- Main IPC: H01P5/00
- IPC: H01P5/00 ; H02J50/20 ; H04B3/52 ; H01P3/18 ; G01S13/02 ; H02J50/12 ; H01Q1/36 ; H01Q9/30 ; G01S13/88

Abstract:
Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards and is electrically coupled to the charge terminal; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor by which data associated with the operational parameter is communicated.
Public/Granted literature
- US20180261902A1 MEASURING OPERATIONAL PARAMETERS AT THE GUIDED SURFACE WAVEGUIDE PROBE Public/Granted day:2018-09-13
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