Invention Grant
- Patent Title: Identifying deviations in data
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Application No.: US15112758Application Date: 2014-01-24
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Publication No.: US10560469B2Publication Date: 2020-02-11
- Inventor: Eric Owhadi
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- International Application: PCT/US2014/013001 WO 20140124
- International Announcement: WO2015/112162 WO 20150730
- Main IPC: H04L29/06
- IPC: H04L29/06 ; G06K9/62 ; G06F17/16 ; G06F17/18

Abstract:
In an example, metrics that cause a deviation in data may be identified by collecting the data for selected metrics stored in a plurality of tables. A metric vector is constructed based on the data for the selected metrics. A probability density may be calculated for the metric vector that indicates a deviation value for the metric vector relative to other metric vectors. Moreover, an outlier metric from the metric vector that causes the deviation value for the metric vector may be identified.
Public/Granted literature
- US20160352767A1 IDENTIFYING DEVIATIONS IN DATA Public/Granted day:2016-12-01
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