Invention Grant
- Patent Title: Method for measuring peeling stability of release film and release film laminate
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Application No.: US15522204Application Date: 2015-10-26
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Publication No.: US10562265B2Publication Date: 2020-02-18
- Inventor: Jun-Hyoung Park , Jang-Soon Kim
- Applicant: LG Chem, Ltd.
- Applicant Address: KR
- Assignee: LG Chem, Ltd.
- Current Assignee: LG Chem, Ltd.
- Current Assignee Address: KR
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: KR10-2014-0147318 20141028
- International Application: PCT/KR2015/011340 WO 20151026
- International Announcement: WO2016/068559 WO 20160506
- Main IPC: G01N19/04
- IPC: G01N19/04 ; B32B7/06 ; B32B7/12 ; B32B27/32 ; B32B29/00 ; B32B5/24 ; B32B29/02 ; B32B27/12 ; B32B37/12 ; B32B27/08 ; B32B27/30 ; B32B27/36 ; B32B43/00 ; B32B5/02 ; B32B27/10 ; B32B27/00 ; B32B5/26 ; B32B27/06 ; B32B37/26
Abstract:
Provided is a method for measuring the peeling stability of a release film and a release film laminate by measuring a high-speed release strength balance and a low-speed strength balance on the basis of General Formulas 1 and 2.
Public/Granted literature
- US20170313025A1 METHOD FOR MEASURING PEELING STABILITY OF RELEASE FILM AND RELEASE FILM LAMINATE Public/Granted day:2017-11-02
Information query
