Invention Grant
- Patent Title: Overlap measuring apparatus and overlap measuring method
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Application No.: US15328236Application Date: 2015-07-23
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Publication No.: US10563972B2Publication Date: 2020-02-18
- Inventor: Takahiro Tsukamoto
- Applicant: BRIDGESTONE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: BRIDGESTONE CORPORATION
- Current Assignee: BRIDGESTONE CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2014-150067 20140723
- International Application: PCT/JP2015/070969 WO 20150723
- International Announcement: WO2016/013613 WO 20160128
- Main IPC: G01B11/04
- IPC: G01B11/04 ; B29D30/30 ; G06T7/70 ; B65H29/00 ; G01B11/14 ; H04N5/247

Abstract:
An apparatus and method accurately measures an amount of overlap in joining together the end portions of a sheet-shaped member constituting a tire. The overlap amount of the sheet-shaped member front and rear ends is measured when the sheet-shaped member having been molded into a predetermined length with molding marks extending on the surface in width direction is wound around the periphery of a molding drum from the front end. In doing so, a detector detects a first molding mark formed on the sheet-shaped member on the rear end side and a second molding mark formed on the sheet-shaped member on the front end side by capturing images of an entire area including the overlap from above by an image capturing device. A calculator calculates the amount of overlap by measuring the distance between the first and second molding marks on the sheet-shaped member from the frames of captured images.
Public/Granted literature
- US20170254638A1 OVERLAP MEASURING APPARATUS AND OVERLAP MEASURING METHOD Public/Granted day:2017-09-07
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