Invention Grant
- Patent Title: Internal temperature measuring apparatus and temperature difference measuring module
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Application No.: US15679609Application Date: 2017-08-17
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Publication No.: US10564046B2Publication Date: 2020-02-18
- Inventor: Shinya Nakagawa
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2015-049708 20150312
- Main IPC: G01K7/02
- IPC: G01K7/02 ; G01K7/01

Abstract:
An internal temperature measuring apparatus includes a base and a MEMS device disposed on the base. The MEMS device includes a top face and a support. The top face includes a first thermopile configured to measure a first temperature difference used to calculate an internal temperature and a second thermopile configured to measure a second temperature difference used to calculate the internal temperature together with the first temperature difference. An orientation in which a cold junction of each thermocouple constituting the first thermopile is viewed from a hot junction coincides with an orientation in which a cold junction of each thermocouple constituting the second thermopile is viewed from a hot junction.
Public/Granted literature
- US20170343422A1 INTERNAL TEMPERATURE MEASURING APPARATUS AND TEMPERATURE DIFFERENCE MEASURING MODULE Public/Granted day:2017-11-30
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