Invention Grant
- Patent Title: Spectral filter and spectrometric device
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Application No.: US15559908Application Date: 2016-03-28
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Publication No.: US10564334B2Publication Date: 2020-02-18
- Inventor: Hidetaka Jidai , Munenori Kawaji , Ryoji Matsuda
- Applicant: Konica Minolta, Inc.
- Applicant Address: JP Tokyo
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP Tokyo
- Agency: Lucas & Mercanti, LLP
- Priority: JP2015-076654 20150403
- International Application: PCT/JP2016/059902 WO 20160328
- International Announcement: WO2016/158853 WO 20161006
- Main IPC: G02B27/00
- IPC: G02B27/00 ; G02B5/28 ; G01J3/36 ; G01J3/26 ; G01J3/28

Abstract:
A spectral filter (10) is provided with a long-pass filter (12) and a short-pass filter (13). The long-pass filter (12) has a film thickness gradient GL wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region longer than a cut-off wavelength WL. The short-pass filter (13) has a film thickness gradient GS wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region shorter than a cut-off wavelength WS. The long-pass filter (12) and the short-pass filter (13) are overlapped such that the single directions match each other. At the positions in the single directions, a transmittance peak is formed by the cut-off wavelength WL being shorter than the cut-off wavelength WS. The film thickness gradient GL is greater than the film thickness gradient GS.
Public/Granted literature
- US20180095207A1 SPECTRAL FILTER AND SPECTROMETRIC DEVICE Public/Granted day:2018-04-05
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