Invention Grant
- Patent Title: Image inspection device, image inspection method, and image inspection program
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Application No.: US15715823Application Date: 2017-09-26
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Publication No.: US10565703B2Publication Date: 2020-02-18
- Inventor: Hiroyuki Kobayashi
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2016-188594 20160927
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
The image inspection device includes: a first extraction unit configured to repeatedly execute processing for moving a predetermined region by a predetermined distance on an inspection target image to extract an image of the predetermined region after movement as a first determination image until a predetermined first ratio of the inspection target image is included in a plurality of first determination images, and a second extraction unit configured to repeatedly execute processing for moving a predetermined region by a distance smaller than the predetermined distance on an image in the inspection target image including a first determination image where a determined degree satisfies a predetermined condition to extract an image of the predetermined region after movement as a second determination image until a predetermined second ratio of the image in the inspection target image including a first determination image is included in a plurality of second determination images.
Public/Granted literature
- US20180089818A1 IMAGE INSPECTION DEVICE, IMAGE INSPECTION METHOD, AND IMAGE INSPECTION PROGRAM Public/Granted day:2018-03-29
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