Invention Grant
- Patent Title: Minimization of plasma doping induced fin height loss
-
Application No.: US15376719Application Date: 2016-12-13
-
Publication No.: US10566242B2Publication Date: 2020-02-18
- Inventor: Chia-Ling Chan , Tsan-Chun Wang , Liang-Yin Chen , Huicheng Chang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L21/223 ; H01L29/66

Abstract:
A plasma doping process provides conformal doping profiles for lightly doped source/drain regions in fins, and reduces the plasma doping induced fin height loss. The plasma doping process overcomes the limitations caused by traditional plasma doping processes in fin structures that feature aggressive aspect ratios and tights pitches. Semiconductor devices with conformal lightly doped S/D regions and reduced fin height loss demonstrate reduced parallel resistance (Rp) and improved transistor performance.
Public/Granted literature
- US20180166341A1 INNOVATIVE APPROACH TO MINIMIZE PLASMA DOPING INDUCED FIN HEIGHT LOSS Public/Granted day:2018-06-14
Information query
IPC分类: