Invention Grant
- Patent Title: Method for layout design and structure with inter-layer vias
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Application No.: US15619959Application Date: 2017-06-12
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Publication No.: US10566278B2Publication Date: 2020-02-18
- Inventor: Yi-Lin Chuang , Ching-Fang Chen , Jia-Jye Shen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H01L23/522 ; H01L23/528

Abstract:
A computer implemented layout method for an integrated circuit (IC) structure and IC structure are provided. Such a method includes: placing a power supply rail pattern in a first device layer of the IC; bundling, for purposes of placement, a voltage level shifter and one or more inter-layer vias together as an integral unit; and placing the integral unit in the first device layer of the IC design such that one or more metal line patterns in the voltage level shifter are located parallel to albeit without overlapping the power supply rail pattern. The placing the integral unit forms a direct electrical connection channel between the voltage level shifter and a metal pattern in a second device layer of the IC design. At least one of the placing operations is performed using a layout generating machine.
Public/Granted literature
- US20170278789A1 METHOD FOR LAYOUT DESIGN AND STRUCTURE WITH INTER-LAYER VIAS Public/Granted day:2017-09-28
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