Invention Grant
- Patent Title: Self-forming spacers using oxidation
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Application No.: US16005782Application Date: 2018-06-12
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Publication No.: US10566417B2Publication Date: 2020-02-18
- Inventor: Kevin K. Chan , Masaharu Kobayashi , Effendi Leobandung
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent L. Jeffrey Kelly
- Main IPC: H01L21/38
- IPC: H01L21/38 ; H01L21/34 ; H01L21/02 ; H01L21/311 ; H01L21/321 ; H01L29/06 ; H01L29/78 ; H01L29/66

Abstract:
A method of forming a self-forming spacer using oxidation. The self-forming spacer may include forming a fin field effect transistor on a substrate, the fin field effect transistor includes a gate on a fin, the gate is perpendicular to the fin; forming a gate spacer on the gate and a fin spacer on the fin, the gate spacer and the fin spacer are formed in a single step by oxidizing an exposed surface of the gate and an exposed surface of the fin; and removing the fin spacer from the fin.
Public/Granted literature
- US20180294334A1 SELF-FORMING SPACERS USING OXIDATION Public/Granted day:2018-10-11
Information query
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