Invention Grant
- Patent Title: Transistor and semiconductor device
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Application No.: US16354327Application Date: 2019-03-15
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Publication No.: US10566460B2Publication Date: 2020-02-18
- Inventor: Shunpei Yamazaki , Masayuki Sakakura
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-069534 20140328
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L27/092 ; H01L29/04 ; H01L29/10 ; H01L27/06 ; H01L27/12 ; H01L29/417 ; H01L29/423 ; H01L21/8238

Abstract:
A transistor with small parasitic capacitance can be provided. A transistor with high frequency characteristics can be provided. A semiconductor device including the transistor can be provided. Provided is a transistor including an oxide semiconductor, a first conductor, a second conductor, a third conductor, a first insulator, and a second insulator. The first conductor has a first region where the first conductor overlaps with the oxide semiconductor with the first insulator positioned therebetween; a second region where the first conductor overlaps with the second conductor with the first and second insulators positioned therebetween; and a third region where the first conductor overlaps with the third conductor with the first and second insulators positioned therebetween. The oxide semiconductor including a fourth region where the oxide semiconductor is in contact with the second conductor; and a fifth region where the oxide semiconductor is in contact with the third conductor.
Public/Granted literature
- US20190214505A1 TRANSISTOR AND SEMICONDUCTOR DEVICE Public/Granted day:2019-07-11
Information query
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