Crosspoint fill-in memory cell with etched access device
Abstract:
An illustrative method of fabricating a memory array structure includes: forming at least one access device layer on an upper surface of a first conductive layer, the access device layer being in electrical connection with the first conductive layer; forming a sacrificial layer on an upper surface of the access device layer; etching the access device layer and the sacrificial layer using a same masking feature to form an access device that is self-aligned with a portion of the sacrificial layer; replacing a portion of the sacrificial layer with memory storage material to form a storage element, a first terminal of the storage element being in electrical connection with the access device; and forming a second conductive layer on an upper surface of the storage element, a second terminal of the storage element being in electrical connection with the second conductive layer.
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