Invention Grant
- Patent Title: Observation apparatus
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Application No.: US15248262Application Date: 2016-08-26
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Publication No.: US10567626B2Publication Date: 2020-02-18
- Inventor: Kenta Matsubara
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2014-037830 20140228
- Main IPC: H04N5/225
- IPC: H04N5/225 ; G02B21/24 ; G02B21/14

Abstract:
An observation device includes: a structured illumination section; a phase difference measurement illumination section; a phase contrast lens that has a phase plate for dimming illumination light for phase difference measurement, where the illumination light for phase difference measurement is incident into the lens, and the structured illumination light is incident into the lens from a side opposite to an incidence side of the ring-shaped illumination; a detection section that detects reflected light of the structured illumination light; and an observation section that images the illumination light for phase difference measurement. When Fourier transform is performed on the structured illumination light, a spatial frequency of the structured illumination light is set on a high-frequency side or a low-frequency side with respect to a position of the phase plate on optical Fourier space.
Public/Granted literature
- US20160366318A1 OBSERVATION APPARATUS Public/Granted day:2016-12-15
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