Invention Grant
- Patent Title: Relay node related measurements
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Application No.: US13978287Application Date: 2011-01-10
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Publication No.: US10567985B2Publication Date: 2020-02-18
- Inventor: Shunliang Zhang
- Applicant: Shunliang Zhang
- Applicant Address: FI Espoo
- Assignee: NOKIA SOLUTIONS AND NETWORKS OY
- Current Assignee: NOKIA SOLUTIONS AND NETWORKS OY
- Current Assignee Address: FI Espoo
- Agency: Squire Patton Boggs (US) LLP
- International Application: PCT/CN2011/000039 WO 20110110
- International Announcement: WO2012/094774 WO 20120719
- Main IPC: H04W24/08
- IPC: H04W24/08

Abstract:
A method for relay node related measurements is provided. The method includes the following steps: obtaining air interface related measurements; and forming form the measurements at least one merely relay node related measurement result. The method can facilitate use of relay nodes and guarantee the advantages provided by the relay nodes.
Public/Granted literature
- US20130279346A1 RELAY NODE RELATED MEASUREMENTS Public/Granted day:2013-10-24
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