Embodiments describing an approach to detecting negative paths for a circuit design based on a circuit timing test of the circuit design. Assigning each negative path to a logic bucket, an integration bucket, or a macro bucket, wherein the logic bucket corresponds to logic design flaws, the integration bucket corresponds to integration design flaws, and the macro bucket corresponds to macro design flaws or design flaws residing within a macro of the circuit design. Detecting a modification to the circuit design based on the logic design flaws, the integration design flaws, and the macro design flaws, and applying the modification to the circuit design to enable manufacturing an integrated circuit, wherein an overall delay between two latches of the integrated circuit is below a predetermined threshold.