Invention Grant
- Patent Title: Method for determining the quality factor of an oscillator
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Application No.: US16142802Application Date: 2018-09-26
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Publication No.: US10578661B2Publication Date: 2020-03-03
- Inventor: Antoine Nowodzinski , Frédéric Souchon
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Applicant Address: FR Paris
- Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Current Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Current Assignee Address: FR Paris
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: FR1759009 20170928
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R23/16 ; G01R31/317 ; G01R23/00 ; B81C99/00 ; H03B5/30 ; G01C19/5656 ; G01C19/5684

Abstract:
A method for determining a quality factor of an electrostatically actuated oscillator, the oscillator having a resonance frequency, the method including generating an excitation voltage defined as being the sum of a sinusoidal voltage and a voltage pulse; applying the excitation voltage at the input of the oscillator; acquiring in the time domain a response voltage present at the output of the oscillator after having ceased applying the excitation voltage at the input of the oscillator; determining the quality factor of the oscillator from the response voltage acquired at the output of the oscillator.
Public/Granted literature
- US20190097578A1 METHOD FOR DETERMINING THE QUALITY FACTOR OF AN OSCILLATOR Public/Granted day:2019-03-28
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