Invention Grant
- Patent Title: Methods, devices, and systems for improved quality inspection of products
-
Application No.: US16293417Application Date: 2019-03-05
-
Publication No.: US10580125B2Publication Date: 2020-03-03
- Inventor: Dongyan Wang , Haisong Gu , Tao Liu
- Applicant: MIDEA GROUP CO., LTD.
- Applicant Address: CN Foshan
- Assignee: MIDEA GROUP CO., LTD.
- Current Assignee: MIDEA GROUP CO., LTD.
- Current Assignee Address: CN Foshan
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; B25J9/16 ; G01N21/95 ; G01N21/88 ; G01B11/30

Abstract:
A method of quality inspection is performed by a robotic arm that includes a plurality of segments, a camera at an end of the robotic arm, and a plurality of joints connecting two segments of the plurality of segments. The method includes (i) inspecting, via the camera, a surface of a product with the camera positioned at a first position, (ii) based on the inspecting, identifying: (a) an area of interest on the surface of the product, and (b) a relative location of the area of interest on the surface, (iii) positioning, based on the relative location of the area of interest on the surface, the camera at a second position, and (iv) inspecting, via the camera, the area of interest on the surface of the product with the camera positioned at the second position. Inspecting the area of interest includes inspecting a subset of the surface of the product.
Public/Granted literature
- US20190206045A1 METHODS, DEVICES, AND SYSTEMS FOR IMPROVED QUALITY INSPECTION OF PRODUCTS Public/Granted day:2019-07-04
Information query