Invention Grant
- Patent Title: Method of reading data about memory device, method of controlling memory controller, and storage device including memory device and memory controller
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Application No.: US16217315Application Date: 2018-12-12
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Publication No.: US10580486B2Publication Date: 2020-03-03
- Inventor: Ji-su Kim , Dae-seok Byeon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey and Pierce, P.L.C.
- Priority: KR10-2017-0181442 20171227
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/28 ; G11C7/14 ; G11C16/34 ; G11C16/04 ; G11C16/30

Abstract:
A method of operating a memory device to read data may include determining, in a first read interval associated with a first read operation, a threshold voltage distribution of a most significant program state of a target logical memory page included in a first physical memory page among a plurality of physical memory pages, the first read operation being an operation of reading the target logical memory page of the first physical memory page; transmitting, to a memory controller, a distribution determination result, the distribution determination result being related to the threshold voltage distribution; receiving, from the memory controller, offset levels corrected based on the distribution determination result; and adjusting a read voltage based on offset levels prior to performing a second read operation on a second physical memory page among the plurality of physical memory pages.
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