Invention Grant
- Patent Title: Method of forming semiconductor device
-
Application No.: US16022737Application Date: 2018-06-29
-
Publication No.: US10580864B2Publication Date: 2020-03-03
- Inventor: Yu-Cheng Tung
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: TW105108724A 20160322
- Main IPC: H01L29/10
- IPC: H01L29/10 ; H01L29/78 ; H01L29/66 ; H01L21/02 ; H01L21/308 ; H01L21/762 ; H01L27/088 ; H01L21/8234 ; H01L29/06 ; H01L29/165

Abstract:
The present invention provides a semiconductor device, including a substrate, a first semiconductor layer, a plurality of first sub recess, a plurality of insulation structures and a first top semiconductor layer. The substrate has a first region disposed within an STI. The first semiconductor layer is disposed in the first region. The first sub recesses are disposed in the first semiconductor layer. The insulation structures are disposed on the first semiconductor layer. The first top semiconductor layer forms a plurality of fin structures, which are embedded in the first sub recesses, arranged alternatively with the insulation structures and protruding over the insulation structures.
Public/Granted literature
- US20180308933A1 METHOD OF FORMING SEMICONDUCTOR DEVICE Public/Granted day:2018-10-25
Information query
IPC分类: