Invention Grant
- Patent Title: Infrared detector, imaging device, imaging system, and method of manufacturing infrared detector
-
Application No.: US16238573Application Date: 2019-01-03
-
Publication No.: US10580916B2Publication Date: 2020-03-03
- Inventor: Shigekazu Okumura , Ryo Suzuki
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2018-004156 20180115
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L27/146

Abstract:
An infrared detector includes, a substrate, a lower contact layer formed on the substrate, a first light receiving layer that is formed on the lower contact layer and has a quantum well structure, an intermediate contact layer formed on the first light receiving layer, a second light receiving layer that is formed on the intermediate contact layer and has a quantum well structure, and an upper contact layer formed on the second light receiving layer. Each of the first light receiving layer and the second light receiving layer includes, a first semiconductor layer that is doped with a first conductivity-type impurity, and a second semiconductor layer that is formed on the first semiconductor layer, and is doped with a second conductivity-type impurity which compensates the first conductivity-type impurity.
Public/Granted literature
- US20190221693A1 INFRARED DETECTOR, IMAGING DEVICE, IMAGING SYSTEM, AND METHOD OF MANUFACTURING INFRARED DETECTOR Public/Granted day:2019-07-18
Information query
IPC分类: