Invention Grant
- Patent Title: MEMS microphone and method for manufacturing the same
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Application No.: US15834424Application Date: 2017-12-07
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Publication No.: US10584025B2Publication Date: 2020-03-10
- Inventor: Xianchao Wang
- Applicant: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION , SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Applicant Address: CN Shanghai CN Beijing
- Assignee: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION,SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Current Assignee: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION,SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Current Assignee Address: CN Shanghai CN Beijing
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN201710045042 20170122
- Main IPC: H04R9/00
- IPC: H04R9/00 ; B81B3/00 ; B81C1/00 ; H04R9/08 ; H04R19/04 ; H04R31/00 ; H04R19/00

Abstract:
A method for manufacturing a semiconductor device includes providing a semiconductor structure including a first electrode layer, forming a sacrificial layer on the first electrode layer, the sacrificial layer including a recess having a pointed bottom defining a depth, forming a second electrode layer on the sacrificial layer, the second electrode layer including a first opening exposing the recess, and forming a support layer filling the recess, the first opening, and on the second electrode layer. A portion of the support layer filling the recess forms a stopper having a height equal to the depth of the recess. The method also includes forming a second opening extending through the support layer and the second electrode layer and exposing a surface of the sacrificial layer, and removing a portion of the sacrificial layer to form a cavity.
Public/Granted literature
- US20180208455A1 MEMS MICROPHONE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2018-07-26
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