Invention Grant
- Patent Title: Slope monitoring system, device for slope stability analysis, method, and program
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Application No.: US15505275Application Date: 2015-05-20
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Publication No.: US10584964B2Publication Date: 2020-03-10
- Inventor: Shinji Kasahara
- Applicant: NEC CORPORATION
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: WOPCT/JP2014/004303 20140821
- International Application: PCT/JP2015/002534 WO 20150520
- International Announcement: WO2016/027390 WO 20160225
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01C9/02 ; E02D17/20 ; G01G17/00 ; G01H17/00 ; G01L19/00 ; G01N33/24 ; G08B21/10

Abstract:
A slope monitoring system includes an analysis formula variable measuring means 81 which measures values of respective analysis formula variables that are obtained when a state of a test layer has been changed from a test environment in which there exist at least an arbitrary test layer or a test layer identical to a material layer forming a monitoring target slope, and a value of a predetermined first observable amount, and an analysis formula variable modeling means 831 which constructs, based on various values obtained from the test environment, for each of the analysis formula variables, a model defined a relationship of them with a second observable amount that is a predetermined observable amount being the same as the first observable amount, or having a known relationship with the first observable amount, or a predetermined third variable that can be calculated from the second observable amount.
Public/Granted literature
- US20170268874A1 SLOPE MONITORING SYSTEM, DEVICE FOR SLOPE STABILITY ANALYSIS, METHOD, AND PROGRAM Public/Granted day:2017-09-21
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