Invention Grant
- Patent Title: Analysis device for determining particulate matter
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Application No.: US16227692Application Date: 2018-12-20
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Publication No.: US10585029B2Publication Date: 2020-03-10
- Inventor: Alexander Schladitz , Kai Klinder
- Applicant: SICK ENGINEERING GMBH
- Applicant Address: DE Ottendorf-Okrilla
- Assignee: SICK ENGINEERING GMBH
- Current Assignee: SICK ENGINEERING GMBH
- Current Assignee Address: DE Ottendorf-Okrilla
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Stanley N. Protigal
- Priority: EP18154509 20180131
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N15/14 ; G01N15/02

Abstract:
An optical analysis device for determining particulate matter includes three light sources having different wavelengths, an apparatus for combining the three transmitted light beams on a common optical path, a measurement volume, an optical axis in the forward scattering direction defines the scattering angle 0°, a light absorption apparatus at 0° that absorbs unscattered light, and six detectors which are arranged at different specified angles which are as close as possible to 0° directly next to the light absorption apparatus, at a second scattering angle between 7° and 40°, at a third scattering angle between 41° and 70°, at a fourth scattering angle between 71° and 115°, at a fifth scattering angle between 116° and 145°, at a sixth scattering angle between 146° and 180°. A control and evaluation unit controls the light sources such that the scattered light is detected in a wavelength selective manner by the detectors.
Public/Granted literature
- US20190234862A1 ANALYSIS DEVICE FOR DETERMINING PARTICULATE MATTER Public/Granted day:2019-08-01
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