- Patent Title: Microparticle measuring device and microparticle analysis method
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Application No.: US16213424Application Date: 2018-12-07
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Publication No.: US10585033B2Publication Date: 2020-03-10
- Inventor: Takuya Okuno , Akinori Kimura , Ichiro Sogawa , Hiroshi Suganuma
- Applicant: Sumitomo Electric Industries, Ltd.
- Applicant Address: JP Osaka-shi
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi
- Agency: Baker Botts L.L.P.
- Agent Michael A. Sartori
- Priority: JP2016-115568 20160609
- Main IPC: G06T7/62
- IPC: G06T7/62 ; G01N15/14 ; G01N33/48 ; G01N21/49 ; G01N21/27 ; H04N5/225 ; H04N5/247 ; G01N15/10

Abstract:
There are provided a microparticle measuring device capable of analyzing microparticles with increased accuracy and a microparticle analysis method. According to a microparticle measuring device 1, transmission images of microparticles in the liquid sample are captured by a plurality of image capturing units that are disposed in mutually different orientations with respect to a liquid feed pipe when viewed in a cross section orthogonal to the flowing direction of a liquid sample in the liquid feed pipe, and the microparticles are analyzed by an analyzing unit on the basis of the transmission images.
Public/Granted literature
- US20190107479A1 MICROPARTICLE MEASURING DEVICE AND MICROPARTICLE ANALYSIS METHOD Public/Granted day:2019-04-11
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