Invention Grant
- Patent Title: X-ray computed tomography gauge
-
Application No.: US15604255Application Date: 2017-05-24
-
Publication No.: US10585051B2Publication Date: 2020-03-10
- Inventor: Jonathan J. O'Hare , Zhanyu Ge
- Applicant: Hexagon Metrology, Inc.
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Nutter McClennen & Fish LLP
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/046 ; G01B3/30 ; G01B21/04

Abstract:
A method of making a gauge for verifying or calibrating an x-ray computed tomography device positions a first plurality of objects on a first substrate, and a second plurality of objects on a second substrate. The method also certifies the positions of both the first plurality of objects on the first substrate, and the second plurality of objects on the second substrate. After certifying both the first and second plurality of objects, the method couples the first substrate with the second substrate.
Public/Granted literature
- US20170343487A1 X-RAY COMPUTED TOMOGRAPHY GAUGE Public/Granted day:2017-11-30
Information query