Invention Grant
- Patent Title: Contact probe and inspection jig
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Application No.: US16011922Application Date: 2018-06-19
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Publication No.: US10585117B2Publication Date: 2020-03-10
- Inventor: Tsugio Yamamoto
- Applicant: YOKOWO CO., LTD.
- Applicant Address: JP Kita-ku, Tokyo
- Assignee: YOKOWO CO., LTD.
- Current Assignee: YOKOWO CO., LTD.
- Current Assignee Address: JP Kita-ku, Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2017-126512 20170628
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R31/02 ; H01R12/00 ; H01R4/48 ; G01R31/28

Abstract:
A contact probe includes a first plunger, a second plunger, and a coil spring. The coil spring is disposed outside the first plunger, and urges the first plunger and the second plunger in a direction away from each other. The first plunger and the second plunger are fitted to each other so as to be slidable with respect to each other. The first plunger includes a large diameter part, and a small diameter part provided on a proximal end side of the large diameter part. The small diameter part is fitted into the second plunger. The coil spring includes a close winding part on a side of the second plunger. Adjacent lines of the close winding parts are brought into close contact with each other and come into electrical contact with each other at least in a compressed state of the coil spring.
Public/Granted literature
- US20190004090A1 CONTACT PROBE AND INSPECTION JIG Public/Granted day:2019-01-03
Information query