Invention Grant
- Patent Title: Recommending measurements based on detected waveform type
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Application No.: US15262406Application Date: 2016-09-12
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Publication No.: US10585121B2Publication Date: 2020-03-10
- Inventor: Ian R. Absher , Kraig M. Strong
- Applicant: TEKTRONIX, INC.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash Graham & Dunn
- Agent Andrew J. Harrington
- Main IPC: G01R13/22
- IPC: G01R13/22 ; G01R13/02 ; G01R23/16 ; G06N7/00 ; G06N20/00

Abstract:
An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.
Public/Granted literature
- US20180074096A1 RECOMMENDING MEASUREMENTS BASED ON DETECTED WAVEFORM TYPE Public/Granted day:2018-03-15
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