A method for testing the quality of a galvanic connection between a first terminal and a conductive layer of a high-voltage condenser bushing assembly is provided. The method includes providing a capacitive test circuit. The capacitive test circuit comprises the first terminal, an AC power source and a measurement unit. The method further includes providing, by the AC power source, a first test current in the capacitive test circuit. The first test current is an AC current at a first test frequency of 10 kHz or higher. The method further includes measuring, by the measurement unit, a test parameter indicative of a resistance of the galvanic connection. The method further includes determining the quality of the galvanic connection from the measured test parameter.