Invention Grant
- Patent Title: Method and system for a multi-view scanner
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Application No.: US16122781Application Date: 2018-09-05
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Publication No.: US10585206B2Publication Date: 2020-03-10
- Inventor: Joseph Bendahan
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/02
- IPC: G01N23/02 ; G01V5/00 ; G01T1/16 ; H05G1/32

Abstract:
An X-ray inspection system for scanning objects is provided. The system includes a stationary X-ray source made of one or more linear modules positioned around a scanning volume, and defining sparsely positioned multiple stationary X-ray source points from which X-rays can be directed through the scanning volume. An X-ray detector array extends around the scanning volume and is arranged to detect X-rays from the source points which have passed through the scanning volume. A conveyor is arranged to convey the objects through the scanning volume and at least one processor processes the detected X-rays to produce three dimensional images of the items.
Public/Granted literature
- US20190137651A1 Method and System for a Multi-View Scanner Public/Granted day:2019-05-09
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