Invention Grant
- Patent Title: Detecting single event upsets and stuck-at faults in RAM-based data path controllers
-
Application No.: US16109621Application Date: 2018-08-22
-
Publication No.: US10585747B2Publication Date: 2020-03-10
- Inventor: David A. Pierce
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Zilka-Kotab, P.C.
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F3/06

Abstract:
In one embodiment, a system includes logic configured to receive data comprising a plurality of data elements, where each data element comprises one or more bits. Further, the logic is configured to output bursts of data comprising the plurality of data elements along with a number of parity bits equal to a number of data elements in the plurality of data elements received from a first parity module to an input of a data path. Further still, the system includes a binary sequence generator configured to create a binary sequence comprising a plurality of bonus bits in a pseudo-random pattern that has less than a predetermined chance of matching any sequence of bits in the data while in the data path. Further still, the first parity module is configured to provide a parity calculation prior to passing the plurality of data elements to the input of the data path.
Public/Granted literature
- US20180365100A1 DETECTING SINGLE EVENT UPSETS AND STUCK-AT FAULTS IN RAM-BASED DATA PATH CONTROLLERS Public/Granted day:2018-12-20
Information query