An integrated circuit (IC) includes a plurality of intellectual properties (IPs), each of the plurality of IPs includes a test logic. A first memory controller provides user data received from at least one of the plurality of IPs to a first memory in a first operation mode. A scanner gathers debugging data from the test logics of the plurality of IPs in a second operation mode. And a second memory controller receives the debugging data from the scanner and provides the debugging data to the first memory in the second operation mode.