Invention Grant
- Patent Title: State estimation apparatus, state estimation method, and integrated circuit
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Application No.: US15468748Application Date: 2017-03-24
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Publication No.: US10586154B2Publication Date: 2020-03-10
- Inventor: Hiromu Hasegawa
- Applicant: MegaChips Corporation
- Applicant Address: JP Osaka
- Assignee: MEGACHIPS CORPORATION
- Current Assignee: MEGACHIPS CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Xsensus LLP
- Priority: JP2016-061002 20160325; JP2016-082679 20160418
- Main IPC: G06N99/00
- IPC: G06N99/00 ; G06T7/00 ; A61B5/024 ; A61B5/091 ; G06N3/08

Abstract:
Provided is a state determination apparatus that appropriately performs pattern classification processing and/or pattern determination processing even when a map generated by the SOM technique includes discontinuous image regions (e.g., split image regions). In the state determination apparatus, the matching processing unit obtains adaptability data indicating a correlation degree between template data indicating a predetermined state and the SOM output data. The state determination unit determines a state of an input data. This allows for appropriately performing pattern classification processing and/or pattern determination processing even when a map generated by the SOM technique includes discontinuous image regions (e.g., split image regions).
Public/Granted literature
- US20170278006A1 STATE ESTIMATION APPARATUS, STATE ESTIMATION METHOD, AND INTEGRATED CIRCUIT Public/Granted day:2017-09-28
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