Invention Grant
- Patent Title: Method for detecting coordinates, coordinate output device and defect inspection device
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Application No.: US15696454Application Date: 2017-09-06
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Publication No.: US10586322B2Publication Date: 2020-03-10
- Inventor: Masato Naka
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2017-056407 20170322
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/73

Abstract:
A method for detecting coordinates includes detecting a first position in an inspection target placed on a placement surface of an inspection stage and a second position in the inspection target separated from the first position. A coordinate shift from the first position to the second position includes a first shift component in a first direction taken along the placement surface, and a second shift component in a second direction taken along the placement surface and crossing the first direction. The method further includes calculating a coordinate in the first direction of the second position using a first function, the first function including the first shift component and the second shift component as variables; and calculating a coordinate in the second direction of the second position using a second function, the second function including the first shift component and the second shift component as variables.
Public/Granted literature
- US20180276806A1 METHOD FOR DETECTING COORDINATES, COORDINATE OUTPUT DEVICE AND DEFECT INSPECTION DEVICE Public/Granted day:2018-09-27
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