Invention Grant
- Patent Title: System and method for feature screening in SLAM
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Application No.: US15901871Application Date: 2018-02-21
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Publication No.: US10586344B2Publication Date: 2020-03-10
- Inventor: Chengzhi Qi
- Applicant: Beijing Jingdong Shangke Information Technology Co., Ltd. , JD.com American Technologies Corporation
- Applicant Address: CN Beijing US CA Mountain View
- Assignee: Beijing Jingdong Shangke Information Technology Co., Ltd.,JD.com American Technologies Corporation
- Current Assignee: Beijing Jingdong Shangke Information Technology Co., Ltd.,JD.com American Technologies Corporation
- Current Assignee Address: CN Beijing US CA Mountain View
- Agency: China Science Patent & Trademark US LLC
- Agent Shanyun Lu
- Main IPC: G01C22/00
- IPC: G01C22/00 ; G06K9/00 ; G06T7/579 ; G06T7/73

Abstract:
A method for performing localization and mapping of a mapping device. The method includes: capturing images of environment by a visual sensor of the mapping device, and processing the captured images to obtain a set of high-resolution images and a set of low-resolution images; determining motion-scale measurement of the mapping device using an inertial sensor and an odometer; generating, by a controller of the mapping device, a first mask corresponding to dynamic features in the low-resolution images; extracting features from the high-resolution images; recovering, by the controller, poses of the mapping device based on the high-resolution images and the motion-scale measurements; filtering out, by the controller, the features from the high-resolution images that correspond to the first mask, to obtain filtered features; and performing, by the controller, localization and mapping using the poses and the filtered features.
Public/Granted literature
- US20190259170A1 SYSTEM AND METHOD FOR FEATURE SCREENING IN SLAM Public/Granted day:2019-08-22
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