Invention Grant
- Patent Title: Magnetic tunnel junction element and magnetic memory
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Application No.: US16308166Application Date: 2017-05-19
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Publication No.: US10586580B2Publication Date: 2020-03-10
- Inventor: Hiroaki Honjo , Shoji Ikeda , Hideo Sato , Tetsuo Endoh , Hideo Ohno
- Applicant: TOHOKU UNIVERSITY
- Applicant Address: JP Sendai
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai
- Agency: Oliff PLC
- Priority: JP2016-114377 20160608
- International Application: PCT/JP2017/018779 WO 20170519
- International Announcement: WO2017/212895 WO 20171214
- Main IPC: G11C11/16
- IPC: G11C11/16 ; H01L27/22 ; H01L43/10 ; H01L27/105 ; H01L29/82 ; H01L21/8239 ; H01L43/02 ; H01L43/08

Abstract:
A magnetic tunnel junction element with a high tunnel magnetic resistance ratio can prevent a recording layer from being damaged. A reference layer includes a ferromagnetic body, and has magnetization direction fixed in the vertical direction. A barrier layer includes non-magnetic body, and disposed on one surface side of the reference layer. A recording layer is disposed to sandwich barrier layer between itself and reference layer. The recording layer includes a first ferromagnetic layer including at least one of Co and Fe, and having a magnetization direction variable in a vertical direction; a first non-magnetic layer including at least one of Mg, MgO, C, Li, Al, and Si, second non-magnetic layer including at least one of Ta, Hf, W, Mo, Nb, Zr, Y, Sc, Ti, V, and Cr, and second ferromagnetic layer including at least one of Co and Fe, and having a magnetization direction variable in a vertical direction.
Public/Granted literature
- US20190304526A1 MAGNETIC TUNNEL JUNCTION ELEMENT AND MAGNETIC MEMORY Public/Granted day:2019-10-03
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