Invention Grant
- Patent Title: Measurement apparatus of vectorial optical fields
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Application No.: US16396618Application Date: 2019-04-26
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Publication No.: US10587345B2Publication Date: 2020-03-10
- Inventor: Zhimin Shi
- Applicant: University of South Florida
- Applicant Address: US FL Tampa
- Assignee: University of South Florida
- Current Assignee: University of South Florida
- Current Assignee Address: US FL Tampa
- Agency: Meunier Carlin & Curfman LLC
- Main IPC: H04B10/556
- IPC: H04B10/556 ; H04B10/70

Abstract:
An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
Public/Granted literature
- US20190393963A1 MEASUREMENT APPARATUS OF VECTORIAL OPTICAL FIELDS Public/Granted day:2019-12-26
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