Invention Grant
- Patent Title: Film deposition method and film deposition apparatus
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Application No.: US15373777Application Date: 2016-12-09
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Publication No.: US10590534B2Publication Date: 2020-03-17
- Inventor: Takeshi Kumagai
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2015-246161 20151217
- Main IPC: C23C16/02
- IPC: C23C16/02 ; C23C16/455 ; C23C16/40 ; C23C16/04 ; H01J37/32 ; C23C16/46 ; C23C16/50

Abstract:
A film deposition method is provided for filling a recessed pattern formed in a surface of a substrate with a film. In the method, a halogen-containing gas is supplied to a top surface of a substrate and an upper portion of a recessed pattern, thereby forming an adsorption blocking group on the top surface of the substrate and the upper portion of the recessed pattern. A first reaction gas is supplied to a surface of the substrate including the top surface and the recessed pattern to cause the first reaction gas to adsorb on an area where the adsorption blocking group is not formed on. A second reaction gas reactable with the first reaction gas is supplied to the surface of the substrate to produce a reaction product of the first reaction gas adsorbed on the bottom portion of the recessed pattern and the second reaction gas.
Public/Granted literature
- US20170175266A1 FILM DEPOSITION METHOD AND FILM DEPOSITION APPARATUS Public/Granted day:2017-06-22
Information query
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