Invention Grant
- Patent Title: Integrated optical device for contactless measurement of altitudes and thicknesses
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Application No.: US15533879Application Date: 2014-12-09
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Publication No.: US10591279B2Publication Date: 2020-03-17
- Inventor: David Reolon , David Marsaut
- Applicant: ASENTYS SAS
- Applicant Address: FR Chateauneuf le Rouge
- Assignee: ASENTYS SAS
- Current Assignee: ASENTYS SAS
- Current Assignee Address: FR Chateauneuf le Rouge
- Agency: Hauptman Ham, LLP
- International Application: PCT/IB2014/066719 WO 20141209
- International Announcement: WO2016/092348 WO 20160616
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G02B21/00 ; G01J3/02 ; G01J3/28

Abstract:
An optical device for contactless measurement of height and/or thickness. The optical device having an axial chromatic aberration in order to encode the height and/or thickness information of an object positioned in the measurement field. The optical system is anchored in a confocal architecture. A detection system decodes the information through a detection system allowing the wavelength(s) focused on the surface(s) of the object to be discriminated. A plurality of points can be measured simultaneously or successively.
Public/Granted literature
- US20180038680A1 INTEGRATED OPTICAL DEVICE FOR CONTACTLESS MEASUREMENT OF ALTITUDES AND THICKNESSES Public/Granted day:2018-02-08
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