Invention Grant
- Patent Title: Comparator
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Application No.: US16101563Application Date: 2018-08-13
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Publication No.: US10591541B2Publication Date: 2020-03-17
- Inventor: Shigekazu Yamada
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/317 ; G11C29/38

Abstract:
A device includes a comparator, a reference signal node electrically coupled to a first input of the comparator, a plurality of test signal nodes, a plurality of first select signal nodes, a first multiplexer coupled between the plurality of test signal nodes and the comparator, a plurality of latches, a plurality of second select signal nodes, and a second multiplexer. Each first select signal node corresponds to a test signal node. The first multiplexer electrically couples one of the plurality of test signal nodes to a second input of the comparator in response to a corresponding first select signal. Each latch corresponds to a test signal node. Each second select signal node corresponds to a latch. The second multiplexer electrically couples the output of the comparator to an input of one of the plurality of latches in response to a corresponding second select signal.
Public/Granted literature
- US20200049763A1 COMPARATOR Public/Granted day:2020-02-13
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