Invention Grant
- Patent Title: Error characterization for control of non-volatile memory
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Application No.: US15913898Application Date: 2018-03-06
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Publication No.: US10592141B2Publication Date: 2020-03-17
- Inventor: Vinay Vijendra Kumar Lakshmi , Raghavendra Gopalakrishnan
- Applicant: Western Digital Technologies, Inc.
- Applicant Address: US CA San Jose
- Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee Address: US CA San Jose
- Agency: Kunzler Bean & Adamson, PC
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G11C29/44 ; G06F11/10 ; G11C29/52 ; G06N5/04 ; G06N3/12

Abstract:
Apparatuses, systems, and methods are disclosed for error characterization for control of non-volatile memory. An apparatus may include an array of non-volatile memory cells and a controller. A controller may be configured to acquire an error characterization for a region of memory. Also, an error characterization may comprise information about one or more types of errors to which a region of memory is susceptible. A controller may be configured to assign a region of memory into a logical group based on an error characterization. Further, a logical group may comprise a plurality of regions of memory. Additionally, a controller may be configured to service a write request by striping data across multiple regions assigned to a logical group.
Public/Granted literature
- US20190278500A1 ERROR CHARACTERIZATION FOR CONTROL OF NON-VOLATILE MEMORY Public/Granted day:2019-09-12
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