• Patent Title: Deformation detecting device and diagnosis system
  • Application No.: US15767263
    Application Date: 2016-10-06
  • Publication No.: US10598478B2
    Publication Date: 2020-03-24
  • Inventor: Akira Koide
  • Applicant: Hitachi, Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: Hitachi, Ltd.
  • Current Assignee: Hitachi, Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: Crowell & Moring LLP
  • Priority: JP2015-204794 20151016
  • International Application: PCT/JP2016/079725 WO 20161006
  • International Announcement: WO2017/065074 WO 20170420
  • Main IPC: G01B7/00
  • IPC: G01B7/00 G01B7/16 G01B1/00
Deformation detecting device and diagnosis system
Abstract:
In the related art, no consideration is given to a configuration of a deformation detecting device, an installation place or an installation method for the measurement target. Therefore, there is provided a deformation detecting device including a film-like elastic body which has a first surface to be adhered to a measurement target and a second surface opposite to the first surface, and in which the second surface has at least one set of a recess portion and a projection portion in a first direction in a state where the first surface is adhered to the measurement target before deformation; a first electrode formed in a region of the recess portion of the second surface; a second electrode formed in a region of the projection portion of the second surface; a film-like piezoelectric body which has a uniform thickness and has a third surface disposed along the second surface of the elastic body and a fourth surface opposite to the third surface, and of which a shear modulus of elasticity is higher than that of the elastic body; a third electrode formed in a region of the fourth surface opposite to the first electrode; and a fourth electrode formed in a region of the fourth surface opposite to the second electrode.
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