Invention Grant
- Patent Title: Deformation detecting device and diagnosis system
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Application No.: US15767263Application Date: 2016-10-06
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Publication No.: US10598478B2Publication Date: 2020-03-24
- Inventor: Akira Koide
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2015-204794 20151016
- International Application: PCT/JP2016/079725 WO 20161006
- International Announcement: WO2017/065074 WO 20170420
- Main IPC: G01B7/00
- IPC: G01B7/00 ; G01B7/16 ; G01B1/00

Abstract:
In the related art, no consideration is given to a configuration of a deformation detecting device, an installation place or an installation method for the measurement target. Therefore, there is provided a deformation detecting device including a film-like elastic body which has a first surface to be adhered to a measurement target and a second surface opposite to the first surface, and in which the second surface has at least one set of a recess portion and a projection portion in a first direction in a state where the first surface is adhered to the measurement target before deformation; a first electrode formed in a region of the recess portion of the second surface; a second electrode formed in a region of the projection portion of the second surface; a film-like piezoelectric body which has a uniform thickness and has a third surface disposed along the second surface of the elastic body and a fourth surface opposite to the third surface, and of which a shear modulus of elasticity is higher than that of the elastic body; a third electrode formed in a region of the fourth surface opposite to the first electrode; and a fourth electrode formed in a region of the fourth surface opposite to the second electrode.
Public/Granted literature
- US20190056211A1 Deformation Detecting Device and Diagnosis System Public/Granted day:2019-02-21
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