Invention Grant
- Patent Title: Optical fiber strain measurement apparatus and optical fiber strain measurement method comprising a transmitter-side optical bandpass filter
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Application No.: US16038272Application Date: 2018-07-18
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Publication No.: US10598519B2Publication Date: 2020-03-24
- Inventor: Hideyuki Iwamura
- Applicant: Oki Electric Industry Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: Oki Electric Industry Co., Ltd.
- Current Assignee: Oki Electric Industry Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo, P.C.
- Priority: JP2017-184201 20170925
- Main IPC: G01D5/353
- IPC: G01D5/353

Abstract:
Object is to enable a directly-modulated semiconductor laser to be applied as a light source of probe light. A transmission unit configured to generate probe light; and a reception unit including a receiver-side optical bandpass filter that extracts a Stokes component of Brillouin backscattered light from backscattered light which is caused by the probe light in a measurement target optical fiber, and a self-delayed heterodyne interferometer that detects a change in a frequency shift amount of the Stokes component as a phase difference are included. The transmission unit includes a directly-modulated light source configured to generate an optical pulse, and a transmitter-side optical bandpass filter provided in a stage following the directly-modulated light source, and configured to transmit wavelength of an ON level of the optical pulse as the probe light, and block wavelength of an OFF level.
Public/Granted literature
- US20190094049A1 OPTICAL FIBER STRAIN MEASUREMENT APPARATUS AND OPTICAL FIBER STRAIN MEASUREMENT METHOD Public/Granted day:2019-03-28
Information query
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