Invention Grant
- Patent Title: Methods and systems for performing test and calibration of integrated sensors
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Application No.: US15063731Application Date: 2016-03-08
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Publication No.: US10598526B2Publication Date: 2020-03-24
- Inventor: Mitesh Agrawal , Preetham M. Lobo , Franco Motika , John D. Parker , Gerard M. Salem , Tobias Webel
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Margaret McNamara
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
Embodiments include methods, and computer system, and computer program products for performing test and calibration of integrated sensors on a processor chip. Aspects include: initializing, by a tester program, an on-chip service engine of processor chip, performing and completing, by on-chip service engine, test and calibration of integrated sensors. The method may also include: loading and decoding tester program into an on-chip service engine memory, testing and calibrating each integrated sensor, which may include: selecting an integrated sensor for test and calibration, loading sensor test and calibration patterns and parameters, and sensor test code, and executing the sensor test code to test and calibrate integrated sensors, writing results of the test and calibration to a predetermined location of the on-chip service engine memory, and writing a return code of test and calibration to another predetermined location of on-chip service engine memory, when every integrated sensor is tested and calibrated.
Public/Granted literature
- US20170261354A1 METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRATED SENSORS Public/Granted day:2017-09-14
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