Invention Grant
- Patent Title: Method for in-situ markers for thermal mechanical structural health monitoring
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Application No.: US15112127Application Date: 2014-08-08
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Publication No.: US10598556B2Publication Date: 2020-03-24
- Inventor: Lyutsia Dautova , Wendell V. Twelves, Jr. , Joe Ott , Evan Butcher , Gary A. Schirtzinger , Rainer J. Herbert
- Applicant: United Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Farmington
- Agency: Kinney & Lange, P.A.
- International Application: PCT/US2014/050296 WO 20140808
- International Announcement: WO2015/026540 WO 20150226
- Main IPC: B22F5/04
- IPC: B22F5/04 ; B33Y40/00 ; B33Y10/00 ; B23K26/342 ; G01L1/25 ; G01N23/20 ; B22F3/105 ; F01D21/00 ; B23K26/70 ; B23K103/14

Abstract:
A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. Then, the residual stress of the component is measured at a location corresponding with the marker material using x-ray techniques.
Public/Granted literature
- US20170067788A1 METHOD FOR IN-SITU MARKERS FOR THERMAL MECHANICAL STRUCTURAL HEALTH MONITORING Public/Granted day:2017-03-09
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