Invention Grant
- Patent Title: Apparatus and method for analyzing particles
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Application No.: US16528044Application Date: 2019-07-31
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Publication No.: US10598586B1Publication Date: 2020-03-24
- Inventor: Jan J. Tatarkiewicz , Miroslav Pejcinovic
- Applicant: HORIBA Instruments Incorporated
- Applicant Address: US CA Irvine
- Assignee: HORIBA INSTRUMENTS INCORPORATED
- Current Assignee: HORIBA INSTRUMENTS INCORPORATED
- Current Assignee Address: US CA Irvine
- Agent Micheal de la Cerra
- Main IPC: G01N15/14
- IPC: G01N15/14

Abstract:
A particle image analyzer is disclosed that includes a transparent moving structure with a load surface and an opposite surface, where a portion of the load surface is constructed to adhere particles. A particle discharge nozzle deposits particles on the load surface and an image sensor positioned adjacent to the load surface takes images of the particles as they move past the image sensor. A light source positioned adjacent to the opposite surface illuminates the particles imaged by the image sensor. The light from the light source defines an illumination path that travels from the light source, through the opposite surface, through the load surface and to the image sensor.
Information query