Invention Grant
- Patent Title: X-ray phase imaging apparatus and method of detecting defect of material containing fibers
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Application No.: US16033739Application Date: 2018-07-12
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Publication No.: US10598611B2Publication Date: 2020-03-24
- Inventor: Satoshi Sano , Taro Shirai , Takahiro Doki , Akira Horiba , Naoki Morimoto
- Applicant: Shimadzu Corporation
- Applicant Address: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JP2017-140647 20170720
- Main IPC: G01N23/041
- IPC: G01N23/041 ; A61B6/00
Abstract:
This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.
Public/Granted literature
- US20190025232A1 X-RAY PHASE IMAGING APPARATUS AND METHOD OF DETECTING DEFECT OF MATERIAL CONTAINING FIBERS Public/Granted day:2019-01-24
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