Invention Grant
- Patent Title: I/O error diagnostics
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Application No.: US15616921Application Date: 2017-06-08
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Publication No.: US10599508B2Publication Date: 2020-03-24
- Inventor: Dash D. Miller , Joseph V. Malinowski , Tabor R. Powelson , David C. Reed
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Nelson and Nelson
- Agent Daniel P. Nelson; Alexis V. Nelson
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
A method for collecting diagnostic information associated with an I/O error is disclosed. In one embodiment, such a method includes detecting an error associated with an input/output (I/O) operation. The method determines whether the error can be re-driven and, if so, enables various diagnostic functions to improve collection of diagnostic information. The method then immediately re-drives the I/O operation associated with the error in order to recreate the error. Using the diagnostic functions that have been enabled, the method captures diagnostic information associated with the recreated error. A corresponding system and computer program product are also disclosed.
Public/Granted literature
- US20180357115A1 I/O ERROR DIAGNOSTICS Public/Granted day:2018-12-13
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