Invention Grant
- Patent Title: Memory test system and an operating method thereof
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Application No.: US15828701Application Date: 2017-12-01
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Publication No.: US10599540B2Publication Date: 2020-03-24
- Inventor: In Ho Choi , Ho Ryong Yoo
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2017-0040086 20170329
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F3/06 ; G11C29/52 ; G11C29/56 ; G11C29/46 ; G11C29/44 ; G11C29/10 ; G11C29/42 ; G06F11/34 ; G11C29/12 ; G11C29/04 ; G11C29/36 ; G11C29/00

Abstract:
A memory test system may include: a data storage device including a nonvolatile memory device, and a controller configured to control an operation of the nonvolatile memory device; and a test device configured to: request a test to the data storage device; request, to the data storage device, an output of a variable to be generated through driving of a firmware for performing the test, while the test is performed in the data storage device; and determine whether the firmware is normally driven based on the variable outputted from the data storage device.
Public/Granted literature
- US20180285228A1 MEMORY TEST SYSTEM AND AN OPERATING METHOD THEREOF Public/Granted day:2018-10-04
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