Memory test system and an operating method thereof
Abstract:
A memory test system may include: a data storage device including a nonvolatile memory device, and a controller configured to control an operation of the nonvolatile memory device; and a test device configured to: request a test to the data storage device; request, to the data storage device, an output of a variable to be generated through driving of a firmware for performing the test, while the test is performed in the data storage device; and determine whether the firmware is normally driven based on the variable outputted from the data storage device.
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